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The Centre supports multi-disciplinary research activities based on Trace Elemental analysis.
(Trace Element : chemical element required in minute quantities by an organism to maintain proper physical
functioning)
Particle Induced X-ray Emission is a non-destructive method of elemental analysis, where the "Particle Induced" referes to the energy source which causes the X-ray emission. In our case PIXE stands for Proton Induced X-ray Emission, which utilizes Proton beams accelerated (upto 3 MeV) by small-sized accelerators . The energetic protons when incident on the sample ejects one of the inner-shell (K- and L-shell) electrons. The resulting vacancy is filled with outer-shell electrons through electron transition, which produces characteristic X-rays. Since X-rays have their energy determined by the atomic number, they bear the finger-prints of the element producing them, providing a tool for elemental analysis. PIXE experiments are carried out at Institute Of Physics, Bhubaneswar, using the 3 MV Tandem Pelletron Accelerator. |
Experimental parameters
| Proton Energy | 2.5 - 3MeV (ideal) |
| Current | 1-50 nA |
| Target-to-Detector distance | 3-5 cm |
| Target is inclined w.r.t beam by | 45 degrees |
| Beam size | 1 – 2 mm |
| Beam Current | 1-50 nA |
| Beam size | 1 – 2 mm |
| Detector Resolution | 160 eV at 5.9 keV |
| Standards | NIST standards |
| Calibration | Am241 source. |
| Backings | Kapton, Mylar |
| Best Sensitivities | 20 < Z < 40; Z > 75 |
| Detection Limits | < 1ppm |