Trace Element Research : EDXRF
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Energy-Dispersive-X-Ray-Fluorescence analysis (ED-XRF) is a convinient tool for elemental analysis. The atoms in the
sample material, which could be any solid, powder or liquid, are excited by X-Rays emitted from a X-Ray tube.
All element specific X-Ray fluorescence signals emitted by the atoms after the photoelectric ionisation are measured
simultaneously in a fixed mounted semi-conductor detector.
An energy dispersive X-ray fluorescence (EDXRF) spectrometer makes use of the fact that the pulse height of the detector signal is proportional to the X-ray photon energy. Usually a multichannel analyzer is used for display and providing the data. Here each channel counts the number of photons with a certain energy level simultaneously. The radiation intensity of each element signal, which is proportional to the concentration of the element in the sample, is recalculated internally from a stored set of calibration curves and can be shown directly in concentration units. EDXRF systems detect elements on the periodic table between atomic numbers 11 (Na) and 92 (U). i Samples can be analyzed non-destructively. Elements in concentrations from as low as a few parts per million to 100% may be analyzed. Accuracy of less than one percent relative error are attainable with comparable reproducibility The ED-XRF Spectrometer commissioned at the UGC-DAE CSR, Kolkata Centre is the EX-3600 model, procured from M/S Jordan Valley, Israel. |
Operational parameters
| Voltage | 50 KV |
| Current | 1 mA |
| Element | Na - U |
| Detector | Si(Li) |
| Detection Limit | 5 - 10 ppm |
| Detector Resolution | 143 eV at 5.9 keV |